Effects of the surface treatment on the measured diffraction peak width of Inconel 718

Author:  Hoffmeister, Schulze, Hessert, Koenig
Source:  Conf Proc 2011: ICSP-11 South Bend, IN USA (pgs. 201-206)
Doc ID:  2011033
Year of Publication:  2011
Abstract:  
Abstract Macroscopic and microscopic residual stresses can be determined by the X-Ray diffraction technique. The macroscopic residual stresses can be deduced from the shift of the diffraction peak position. The diffraction peak widths are a measure of the microscopic residual stresses and are often directly correlated with the cold work of a material. Aspects such as the strain rate or the stress state by which the cold work was induced aren